JPS623046U - - Google Patents
Info
- Publication number
- JPS623046U JPS623046U JP9455885U JP9455885U JPS623046U JP S623046 U JPS623046 U JP S623046U JP 9455885 U JP9455885 U JP 9455885U JP 9455885 U JP9455885 U JP 9455885U JP S623046 U JPS623046 U JP S623046U
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- sputtering
- beam gun
- gun
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004544 sputter deposition Methods 0.000 claims description 4
- 238000010894 electron beam technology Methods 0.000 claims 2
- 150000002500 ions Chemical class 0.000 claims 2
- 238000005211 surface analysis Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9455885U JPS623046U (en]) | 1985-06-22 | 1985-06-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9455885U JPS623046U (en]) | 1985-06-22 | 1985-06-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS623046U true JPS623046U (en]) | 1987-01-09 |
Family
ID=30653165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9455885U Pending JPS623046U (en]) | 1985-06-22 | 1985-06-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS623046U (en]) |
-
1985
- 1985-06-22 JP JP9455885U patent/JPS623046U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6251144A (ja) | 質量分析計 | |
JPS58110956U (ja) | 荷電粒子照射装置 | |
JPS623046U (en]) | ||
EP0003659A3 (en) | Apparatus for and method of analysing materials by means of a beam of charged particles | |
JPS6031655U (ja) | イオンマイクロアナライザ | |
JPH0229151U (en]) | ||
JPH067471B2 (ja) | 質量分析装置 | |
JPS61151333U (en]) | ||
JPS63112747U (en]) | ||
JP2555359Y2 (ja) | 半導体装置の製造装置 | |
JPS6339855U (en]) | ||
JPH0214358U (en]) | ||
JPS6119774U (ja) | 走査電子顕微鏡を用いた電位測定装置 | |
JPS63167655U (en]) | ||
JPS6312153U (en]) | ||
JPS6253561U (en]) | ||
JPH0388258U (en]) | ||
JPH02118254U (en]) | ||
JPS6339853U (en]) | ||
JPS6398369U (en]) | ||
JPH01112554U (en]) | ||
JPS58182140U (ja) | 蒸着装置 | |
JPH0455754U (en]) | ||
JPS6398368U (en]) | ||
JPH03109046U (en]) |